Meiji MA517 Auxiliary Lens for EMZ Series — 0.5X Magnification, 150mm Working Distance

The Meiji MA517 is a 0.5X auxiliary objective lens (often used as a “Barlow” lens) designed to increase working distance and widen the field of view on select Meiji EMZ stereo microscope bodies. With a 150mm working distance, MA517 is a common configuration choice for cleanroom and laboratory inspection benches where tool clearance, rework access, or tall parts make standard working distance limiting.

What it changes: MA517 reduces system magnification by half (0.5X) while increasing working distance to 150mm—helping operators see more area and work more comfortably under the microscope.

Specifications:

Accessory type: Auxiliary lens (auxiliary objective / Barlow-style)
Magnification factor: 0.5X
Working distance (W.D.): 150mm (5.9")
Compatible microscope bodies (manufacturer-stated): EMZ-1, EMZ-2, EMZ-2TR, EMZ-5, EMZ-5D, EMZ-5TR, EMZ-5TRD, EMZ-13, EMZ-13TR
Typical use intent: Increase clearance under the objective and broaden viewing area for inspection/rework tasks

Where MA517 Fits in Cleanrooms and Laboratories (and Why)

In cleanrooms and QC labs, microscopes are often used for surface inspection and hands-on rework where the operator needs room for tweezers, soldering tools, fixtures, or gloved hands. Increasing working distance helps reduce awkward posture, improves access to tall assemblies, and supports repeatable inspection angles and lighting geometry.

Typical program fit: Electronics inspection/rework, medical device component inspection, incoming inspection, and cleanroom defect review stations where clearance and ergonomics drive throughput.

Because MA517 reduces magnification by half, it is best used when the limiting factor is clearance and coverage rather than maximum detail. Many teams run a “scan vs confirm” workflow: scan with wider coverage (0.5X auxiliary lens installed), then confirm with a configured higher-power station or camera measurement when needed.

MA517 Features:

0.5X auxiliary lens for select Meiji EMZ stereo microscope bodies
150mm working distance for improved tool clearance and bench ergonomics
Supports wider viewing coverage for scanning and general inspection
Modular accessory approach supports bench standardization across stations

MA517 Benefits:

More clearance for work: better access for tweezers, fixtures, and gloved hands under the objective.
Improved ergonomics: reduces awkward posture and supports longer inspection sessions with less fatigue.
Faster scanning: wider field presentation helps operators find defects faster before switching to confirmation.
Standardized bench builds: supports consistent station configuration when multiple microscopes are deployed.

Common Applications:

Electronics inspection and rework where tool clearance is required
Medical device component inspection (tall parts, fixtures, fine manipulation)
Incoming inspection and general QC scanning
Cleanroom defect review stations requiring consistent viewing geometry

Optics Cleaning (Recommended for Auxiliary Lenses & Stereo Objectives)

Auxiliary lenses are exposed to the same contamination risks as objectives: airborne particulate, solvent haze, and handling residues. SOSCleanroom recommends optical-grade swabs and specialty low-lint wipers to support routine cleaning without fiber shedding.

Link to Meiji MA517 Product Details / Datasheet: Manufacturer Website

Notes: Need help selecting the correct auxiliary lens factor for your inspection workflow? Open the SOSCleanroom Technical Vault tab above for a practical “scan vs confirm” setup checklist and cleanroom optics-care discipline guidance.

SOSCleanroom supports microscopy programs with compatible accessories and optical cleaning supplies designed for controlled environments.

Product page updated: Jan. 21, 2026 (SOS Technical Staff)

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The Technical Vault

By SOSCleanroom

Last reviewed: Jan. 21, 2026 | Audience: cleanroom operations, QA/QC, lab managers, manufacturing engineering, EHS

Auxiliary (“Barlow”) Lenses in Stereo Microscopy: How MA517 Trades Magnification for Clearance and Throughput

Meiji MA517 — 0.5X factor, 150mm working distance, EMZ compatibility control, and optics-care discipline

Scan vs confirm workflow Bench ergonomics Configuration control

The one-paragraph answer

The Meiji MA517 is a 0.5X auxiliary lens that increases working distance to 150mm on selected Meiji EMZ stereo microscope bodies. In practical inspection programs, MA517 is used when clearance and coverage matter more than maximum magnification—providing room for tools, fixtures, and gloved handling while supporting faster scanning of larger areas. Because it reduces total magnification by half, MA517 should be deployed with a documented “scan vs confirm” workflow so high-detail confirmation is performed on a configured higher-power station when needed.

Operational problem MA517 is solving

Insufficient clearance: tools/fixtures collide with the objective area; tall parts cannot be handled comfortably.
Slow scanning: limited field coverage increases inspection time for large surfaces or many features.
Ergonomic strain: awkward posture and short clearance increase fatigue and decision variability across shifts.
Lighting geometry limitations: certain ring/oblique lighting setups work better when there is additional space under the optics.

Microscopy education: stereo microscope engineering vs. compound microscope engineering

Stereo microscopes are engineered with two optical paths to provide a true 3D image—optimized for inspection and manipulation where depth perception matters. Their accessory ecosystem (auxiliary lenses, stands, lighting) is built to tune working distance, field coverage, and ergonomics for hands-on workflows.

Compound microscopes use a single optical axis optimized for higher magnification analytical viewing (commonly slide-based) with transmitted illumination. In compound workflows, objective selection and illumination/condenser tuning dominate outcomes; “clearance for tools” is typically not the primary design driver.

Why MA517 exists: It is a stereo accessory that explicitly optimizes the hands-on inspection environment—trading magnification for clearance and workflow speed.

Compatibility and configuration control (bench standardization)

MA517 is typically used on select Meiji EMZ stereo microscope bodies (e.g., EMZ-5 / EMZ-13 families). For controlled inspection programs, record (1) the microscope body model, (2) installed eyepieces, (3) auxiliary lens factor, and (4) illumination geometry as configuration-controlled items.

Receiving checklist: Validate working clearance and field coverage using your defect standards before full deployment, and document the configuration in the bench log.

Best-practice use: “scan vs confirm” workflow (SOP-ready)

Suggested SOP insert (template-style)

Use MA517 configuration for primary scanning where coverage and clearance are the limiting factors.
Define the trigger for “confirm” (e.g., defect suspected, threshold feature size, rework decision point).
Confirm on a higher-power configured station (higher auxiliary factor or different bench) or camera measurement system where required.
Lock illumination geometry and intensity levels for repeatability across shifts.
Record configuration in bench log (body model, eyepieces, auxiliary lens factor, lighting setup).

Throughput note: MA517 often improves throughput not by “more magnification,” but by making it easier to handle parts and scan more area per glance.

Optics cleaning and contamination control (aux lens discipline)

Auxiliary lenses sit close to the work zone and are exposed to airborne particulate, process haze, and handling residue. Clean with optical-grade tools that minimize fiber shedding and reduce scratch risk on coated optics.

Suggested optics-cleaning SOP insert (template-style)

Remove loose particles using an approved blower/air method before wiping.
Use a fresh optical swab or specialty low-lint wiper; apply minimal approved solvent (damp, not dripping).
Wipe gently in one direction; avoid heavy pressure and repeated scrubbing.
Replace swab/wiper frequently; do not reuse a loaded cleaning surface.
Cover the microscope when idle; store away from chemical vapor sources and direct airflow.

Helpful links

Source basis

SOSCleanroom product listing context (SKU positioning and application intent).
Manufacturer specifications and published accessory compatibility for MA517.
Common inspection microscopy best practices: scan vs confirm workflow design, bench standardization, and optics cleaning controls.

Compliance note: This Technical Vault article is provided for educational support. Always follow facility SOPs, QA requirements, and validation/qualification plans.

Document control: Rev. Jan. 21, 2026 (SOS Technical Staff)