Meiji MA535 Super Widefield High Eyepoint 15X Eyepieces (Sold in Pairs) — FN 16.0, 19mm Reticle Mount

The Meiji MA535 is a matched pair of 15X Super Widefield, High-Eyepoint eyepieces engineered for long-session inspection where operator comfort and repeatable interpretation matter. With a Field Number (FN) of 16.0 and a 19mm reticle mount, MA535 supports higher-detail viewing and optional reticle-based verification—common in cleanroom inspection bays, electronics QA, and precision manufacturing workstations.

Configuration note: Eyepieces are a controlled configuration component. Confirm microscope series compatibility, illumination strategy, and whether a reticle/measurement workflow is required by your SOP before standardizing across benches.

Specifications:

Magnification: 15X
Type: Super Widefield, High Eyepoint (paired)
Field Number (FN): 16.0
Reticle mount: 19mm
Outer diameter (O.D.): 30.5mm
Compatibility (manufacturer-stated): EMZ (Zoom), EMT (Turret), EMF (Fixed) stereo microscope families

Where MA535 Fits in Cleanrooms and Laboratories (and Why)

In controlled environments, microscope outcomes are often limited by operator variability and visual fatigue, not by the microscope body itself. High-eyepoint eyepieces are commonly chosen when teams want a more forgiving viewing position and improved comfort across long shifts—while still maintaining widefield situational awareness for scanning and confirmation.

Typical program fit: MA535 is frequently selected for inspection benches and rework stations where higher eyepiece magnification supports defect confirmation, and where comfort and repeatability are required for consistent decisions across operators and shifts.

As eyepiece magnification increases, the perceived field of view and brightness can change depending on the optical system and lighting. Validate illumination geometry (ring, oblique, coaxial/vertical) as part of configuration control.

About the Manufacturer:

Meiji Techno builds modular microscope platforms where eyepieces, auxiliary lenses, illumination, and stands are selected to match the inspection objective. This modularity supports standardized bench builds and disciplined change control—important for QA/QC environments that rely on repeatable visual inspection.

MA535 Features:

15X Super Widefield eyepieces for higher-detail confirmation
High-eyepoint design for improved viewing comfort in long sessions
FN 16.0 field specification to support widefield scanning
19mm reticle mount for measurement/verification reticles (reticle sold separately)
Matched pair for consistent left/right viewing performance

MA535 Benefits:

Comfort-forward standardization: supports repeatable inspection decisions by reducing fatigue-driven variability.
Higher confirmation power: increases perceived detail without changing the microscope body.
Verification readiness: reticle mount supports SOP-driven measurement checks.
Bench consistency: paired eyepieces help normalize viewing conditions across stations.

Common Applications:

Cleanroom inspection benches (foreign material, edge condition, surface defects)
Electronics inspection and rework support (fine features and confirmation checks)
Medical device component inspection and QA verification
Precision manufacturing inspection (burrs, scratches, coating irregularities)
Reticle-based visual checks when measurement is part of the SOP

Optics Cleaning (Recommended for Eyepieces)

Eyepieces are high-touch optics and frequently accumulate oils and residue films that reduce contrast and can create inspection artifacts. SOSCleanroom recommends using optical-grade swabs and low-lint wipers to minimize fiber shedding and protect coated optical surfaces during routine cleaning.

Link to Meiji MA535 Product Details / Datasheet: Click Here

Other Similar Products Available From SOSCleanroom.com

Meiji MA503 (15X Super Widefield) — alternate 15X eyepiece option when high-eyepoint is not required
Stereo microscope eyepieces — browse all Meiji eyepiece options
Illuminators — ring lights, fiber/LED lighting, and accessories

Notes: Need help selecting eyepiece magnification vs. brightness and field of view, or adding a reticle for standardized checks? Open the SOSCleanroom Technical Vault tab above for a practical selection checklist and optics-care discipline guidance.

SOSCleanroom supports microscopy programs with responsive technical support, compatible accessories, and optical cleaning supplies designed for controlled environments.

Product page updated: Jan. 21, 2026 (SOS Technical Staff)

© 2026 SOS Supply. All rights reserved.

The Technical Vault

By SOSCleanroom

Last reviewed: Jan. 21, 2026 | Audience: cleanroom operations, QA/QC, lab managers, manufacturing engineering, EHS

Eyepieces as a Controlled Input: Why High-Eyepoint 15X Upgrades Change Inspection Repeatability

Meiji MA535 — FN 16.0, 19mm reticle mount, selection checklist, and optics-care discipline for cleanroom and lab benches

High-eyepoint ergonomics Reticles & verification Optics cleaning discipline

The one-paragraph answer

The MA535 is a paired 15X Super Widefield, High-Eyepoint eyepiece set used to increase perceived detail while improving long-session viewing comfort. In controlled inspection environments, eyepieces should be treated as a controlled input because they directly impact field presentation (via FN 16.0), the ability to incorporate standardized checks (via the 19mm reticle mount), and the likelihood of inspection artifacts caused by residue films and particulate on high-touch optics. MA535 is intended for compatible Meiji EMZ/EMT/EMF stereo microscope families; confirm model compatibility and bench illumination as part of standardization.

Why this matters in QA/QC: Inspection decisions drift when operators are uncomfortable or when benches are configured differently. Eyepiece standardization reduces variability and improves comparability across shifts.

Operational problem MA535 is solving

Defects that require stronger confirmation than standard eyepiece configurations provide.
Fatigue-driven inconsistency in long-session inspection, rework, and verification workflows.
Non-standard measurement checks when reticles are required but eyepieces are not reticle-ready.
False defect calls caused by smudges, residue films, and particulate contamination on eyepiece optics.

Microscopy education: how stereo microscopes are engineered vs. compound microscopes

Stereo microscopes (inspection microscopes) use two independent optical paths to produce a true 3D image. This improves depth judgment for edges, step height, surface relief, and tool position—critical in inspection and rework. Eyepieces are often used as a configuration lever in stereo systems to tune confirmation detail and operator comfort without changing the microscope body.

Compound microscopes are engineered around a single optical axis and are optimized for higher magnification analytical viewing (often slides) with transmitted illumination. In compound workflows, objectives and illumination/condenser tuning typically dominate performance more than eyepiece selection.

Practical takeaway: If the workflow is hands-on inspection and manipulation, stereo engineering and eyepiece ergonomics are usually the fastest path to improved outcomes. If the workflow is slide-based analysis, compound architecture is typically the correct platform.

How to qualify eyepieces for inspection benches (selection checklist)

Eyepieces should be qualified like any other inspection input: they change what operators see, how long they can work, and how consistently results are interpreted across benches. Use the checklist below to standardize MA535 use.

Qualification checklist (SOP + QA alignment)

Defect drivers: define the defect types that require 15X confirmation (scratches, particles, edge damage, coating non-uniformity, solder defects).
Brightness/illumination: validate lighting geometry (ring vs oblique vs coaxial) at the target magnification range.
Field of view vs detail: confirm scanning speed requirements versus confirmation needs (higher eyepiece power can reduce field coverage per glance).
Ergonomics: standardize eyecup/eye position, diopter/IPD settings, and viewing posture across shifts.
Reticle workflow: if measurements are required, define reticle type, calibration method, and document control expectations.
Change control: lock eyepiece part number and configuration as part of the bench build specification.

Metrics glossary (quick interpretation)

Field Number (FN): related to the observable field diameter; impacts the visible area at a given magnification.
High-eyepoint: a design feature that provides a more forgiving viewing position and can reduce fatigue in long sessions.
Reticle mount: mechanical provision for inserting a reticle; MA535 uses a 19mm reticle size.

Optical cleaning and contamination control (eyepiece-focused)

Eyepieces are high-touch optics. Oils, glove residue, and particulate can create haze and contrast loss that is often misread as a product defect. Use optical-grade tools designed to minimize fiber shedding and reduce scratch risk on coated surfaces.

Suggested eyepiece-cleaning SOP insert (template-style)

Inspect for loose particles; remove with an approved blower/air method before wiping.
Use a fresh optical swab or low-lint wiper; apply minimal approved solvent to the swab (damp, not dripping).
Wipe gently in one direction; avoid aggressive pressure and repeated scrubbing.
Replace swab/wiper frequently; do not reuse a loaded cleaning surface.
Cover the microscope when idle; store away from airflow paths and chemical vapor sources.

Reticle handling note: If you install a reticle/micrometer, avoid touching internal optical surfaces and follow manufacturer guidance for reticle retaining rings to prevent scratches.

Helpful links

Source basis

SOSCleanroom product listing context (FN 16.0 and 19mm reticle mount merchandising/compatibility context).
Meiji MA535 product page and datasheet (FN 16.0, 30.5mm O.D., reticle mount, and intended microscope family fit).
Common inspection microscopy best practices: ergonomics standardization, reticle/verification discipline, and optics cleaning controls.

Compliance note: This Technical Vault article is provided for educational support. Always follow facility SOPs, QA requirements, and validation/qualification plans.

Document control: Rev. Jan. 21, 2026 (SOS Technical Staff)