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Meiji MA794 Auxiliary Lens for EMZ-8 (0.5X / W.D. 174mm)

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MA794
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Meiji MA794 Auxiliary Lens for EMZ-8 — 0.5X Magnification, 174mm Working Distance

The Meiji MA794 is a 0.5X auxiliary objective lens designed specifically for the Meiji EMZ-8 stereo microscope. It increases working distance to approximately 174mm while widening the field of view—providing a strong balance of clearance and coverage for inspection and rework tasks where operators still need meaningful magnification without the tight clearance of higher-power configurations.

Quick selection note: MA794 is the “workbench balance point” for EMZ-8 users—more clearance and coverage than standard, with less magnification reduction than ultra-long working distance options (e.g., 0.35X).

Specifications:
  • Accessory type: Auxiliary lens (auxiliary objective / “Barlow” style)
  • Magnification factor: 0.5X
  • Working distance (W.D.): ~174mm (6.9")
  • Compatible microscope body: Meiji EMZ-8 stereo microscope
  • Primary effect: Increases clearance and field of view; reduces effective magnification
  • Use intent: Tool/fixture-friendly inspection and rework with balanced detail capability
Where MA794 Fits in Cleanrooms and Laboratories (and Why)

MA794 is frequently selected for production benches and cleanroom workstations where operators need enough clearance to use tweezers, probes, fixtures, or gloved hands under the microscope while still maintaining strong detail visibility. For many EMZ-8 setups, 0.5X is the practical “daily driver” when standard working distance feels cramped but a 0.35X configuration reduces magnification more than the workflow can tolerate.

Typical program fit: electronics inspection and rework, medical device assembly inspection, precision mechanical assembly review, and cleanroom benches where fixtures and controlled handling are required.

In controlled environments, added clearance is also a contamination-control benefit: fewer accidental contacts with optics and fewer awkward handling moves reduces the risk of part drops, glove contact events, and operator fatigue over long shifts.

MA794 Features:
  • 0.5X auxiliary lens designed specifically for EMZ-8 stereo microscope systems
  • ~174mm working distance for improved clearance and bench ergonomics
  • Wider field of view for scanning and orientation
  • Supports fixture- and tool-intensive workflows without extreme magnification reduction
MA794 Benefits:
  • More working clearance: reduces collisions and supports comfortable tool use under magnification.
  • Balanced performance: improves coverage and handling while retaining practical detail capability.
  • Higher throughput: fewer repositioning cycles during inspection, assembly, or rework.
  • Better ergonomics: reduced strain supports more consistent inspection decisions across shifts.
Common Applications:
  • Electronics inspection and rework (clearance for probes and tools)
  • Medical device component inspection and assembly support
  • Mechanical assemblies with fixtures and jigs
  • Cleanroom benches requiring gloved manipulation under magnification
Selection Notes (MA794 vs. 0.35X and Higher-Factor Options)
  • MA794 (0.5X): best balance of clearance and detail for many EMZ-8 workbench programs.
  • MA792 (0.35X): maximum clearance and coverage when tooling/fixtures dominate, with more magnification reduction.
  • Higher factors (0.75X / 1.0X+): selected when fine-detail resolution is the limiting constraint, accepting less clearance.
Optics Cleaning (Recommended for Stereo Objectives and Auxiliary Lenses)

Auxiliary lenses sit close to the work zone and pick up haze, particulate, and handling residues. Use optical-grade swabs and specialty low-lint wipers to maintain contrast and avoid fiber shedding on coated optics.


Link to Meiji MA794 Product Details:
Manufacturer Product Page

Related EMZ-8 Auxiliary Lenses Available From SOSCleanroom.com

Notes: Auxiliary lens factor should be documented as part of station configuration control. For help standardizing “scan” vs “confirm” benches and maintaining consistent defect decisions, consult the SOSCleanroom Technical Vault.

Product page updated: Jan. 21, 2026 (SOS Technical Staff)

© 2026 SOS Supply. All rights reserved.

The Technical Vault
By SOSCleanroom
Last reviewed: Jan. 21, 2026 | Audience: cleanroom operations, QA/QC, lab managers, manufacturing engineering, EHS
Choosing a 0.5X Auxiliary Lens on an EMZ-8: The Practical Balance Between Clearance and Detail
Meiji MA794 — 174mm working distance, bench standardization, and contamination-control benefits of better ergonomics
Clearance-driven workflows Scan vs confirm stations Stereo vs compound education
The one-paragraph answer

The Meiji MA794 is a 0.5X auxiliary lens for the EMZ-8 stereo microscope that increases working distance to approximately 174mm. It is selected when the workflow needs better clearance for tools and fixtures, but still requires meaningful magnification for routine defect review. For many production benches, 0.5X is the practical “daily driver” configuration—improving ergonomics and throughput without the larger magnification reduction associated with ultra-long working distance (0.35X) setups.

Operational problems MA794 helps solve
  • Tool collisions and cramped clearance: probes, tweezers, and fixtures contact the objective area.
  • Slow handling cycles: repeated repositioning to “fit under the lens” reduces throughput and increases handling risk.
  • Operator fatigue: constrained posture increases variability in inspection decisions across shifts.
  • Contamination-control friction: awkward moves increase glove contact events and accidental touches to optics/surfaces.
Stereo microscope engineering vs. compound microscope engineering

Stereo microscopes deliver true depth perception through dual optical paths, enabling manipulation and assembly work. Accessories like MA794 tune the system for the workflow—balancing clearance, coverage, and detail for hands-on benches. Compound microscopes are typically optimized for higher magnification analytical viewing (often slide-based) where tool clearance is not a primary design constraint.

Why this matters: MA794 is a workflow-enabling accessory for stereo microscopy because stereo microscopes are used as production tools, not just analytical instruments.

How to choose between 0.5X and 0.35X (decision logic)
Selection by limiting constraint
  • If tooling/fixtures dominate: 0.35X (max clearance) is often the best option.
  • If you need balance: 0.5X is commonly the best “daily driver” because it preserves more detail while still improving clearance significantly.
  • If detail is limiting: higher factors (0.75X / 1.0X+) increase apparent size but reduce clearance.

Practical rule: If operators are “fighting the microscope” to get tools under the objective, clearance is limiting (go lower factor). If operators are missing small features, detail is limiting (go higher factor).

Bench standardization and configuration control

Treat auxiliary lens factor as configuration-controlled. If different benches use different factors, the same part will appear at different apparent size and coverage. Standardization reduces “same part, different decision” outcomes and simplifies training and auditing.

Bench log (minimum recommended fields)
  • Microscope body model (EMZ-8)
  • Eyepiece model and magnification
  • Auxiliary lens factor (MA794 0.5X)
  • Stand type and typical working height
  • Illumination type and typical intensity settings
Optics cleaning and contamination control

Better clearance reduces accidental contact events, but optics still require disciplined cleaning. Use optical-grade swabs and specialty low-lint wipers to maintain contrast and prevent fiber shedding on coated surfaces. Replace swabs/wipers frequently and avoid dragging particles across glass.

Suggested optics-cleaning SOP insert (template-style)
  1. Remove loose particles (blower/air method) prior to wiping.
  2. Dampen a fresh optical swab/wiper with minimal approved solvent.
  3. Wipe gently in one direction; do not scrub with heavy pressure.
  4. Replace the cleaning surface frequently; do not reuse loaded swabs/wipers.
  5. Cover the microscope when idle to reduce airborne deposition.
Source basis
  • SOSCleanroom product listing context (application positioning and program-fit language).
  • Manufacturer-stated specifications for MA794 (0.5X factor, ~174mm working distance, EMZ-8 compatibility).
  • Common inspection microscopy best practices: bench configuration control, scan vs confirm station design, and optics cleaning discipline.
Compliance note: This Technical Vault article is provided for educational support. Always follow facility SOPs, QA requirements, and validation/qualification plans.
Document control: Rev. Jan. 21, 2026 (SOS Technical Staff)
© 2026 SOS Supply. All rights reserved.