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Meiji MA802 Auxiliary Lens for EMZ-8 (2.0X / W.D. 39.2mm)

Meiji MA802 Auxiliary Lens for EMZ-8 (2.0X / W.D. 39.2mm)

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Meiji MA802 Auxiliary Lens for EMZ-8 — 2.0X Magnification, ~36.6–39.2mm Working Distance

The Meiji MA802 is a 2.0X auxiliary objective lens (auxiliary lens / “Barlow” style) designed for Meiji EMZ-8 series stereo microscope bodies. It increases effective magnification for high-detail inspection and confirmatory review, with a tight working distance typically published around 36.6mm (some configurations/listings reference ~39.2mm). MA802 is selected when the limiting factor is fine-feature discrimination rather than tool clearance.

Quick selection note: MA802 is a “detail-first” auxiliary lens. Expect higher apparent size and reduced clearance. For assembly/rework benches where tools must fit under the objective, consider 0.5X or 0.35X options instead.

Specifications:
  • Accessory type: Auxiliary lens (auxiliary objective / “Barlow” style)
  • Magnification factor: 2.0X
  • Working distance (W.D.): ~36.6mm typical; some listings reference ~39.2mm (verify to your EMZ-8 configuration)
  • Compatible microscope body: Meiji EMZ-8 series stereo microscope bodies (model-dependent)
  • Primary effect: increases effective magnification; reduces working distance and clearance
  • Use intent: fine detail inspection, defect confirmation, surface/edge review
Where MA802 Fits in Cleanrooms and Laboratories (and Why)

MA802 is best positioned as a confirmatory inspection configuration for EMZ-8 benches—used when the inspection decision depends on visibility of very small features (micro-scratches, edge chips, coating anomalies, or subtle surface artifacts). In controlled environments, separating “scan” benches (coverage/clearance) from “confirm” benches (detail) improves throughput and reduces decision drift.

Typical program fit: defect confirmation, high-detail surface review, edge quality checks, and tight-tolerance visual inspection workflows.

Because working distance is tight, MA802 benefits from stable staging, consistent illumination geometry, and disciplined optics cleaning to avoid mistaking smudges or haze for defects.

MA802 Features:
  • 2.0X auxiliary lens engineered for Meiji EMZ-8 stereo microscope systems
  • High-detail viewing capability for confirmatory inspection
  • Supports standardized “scan vs confirm” bench roles
  • Configuration-controlled accessory for consistent inspection outcomes
MA802 Benefits:
  • Maximum apparent detail: improves discrimination of small features and borderline defects.
  • Higher confidence decisions: reduces false rejects and unnecessary rework when paired with stable lighting and staging.
  • Better repeatability: standardizing auxiliary factor reduces operator-to-operator variability.
  • Confirm bench capability: complements lower-factor “scan” benches for efficient two-stage workflows.
Common Applications:
  • Micro-scratch and surface artifact confirmation
  • Edge chip / burr / finishing quality review
  • Coating/film anomaly checks where subtle contrast differences matter
  • Electronics and medical device confirm inspection (with stable staging)
Selection Notes (MA802 vs. 1.5X and Clearance-Focused Options)
  • MA802 (2.0X): highest apparent size for detail-driven confirm inspection; tight clearance.
  • MA795 (1.5X): strong detail improvement with slightly less clearance penalty than 2.0X.
  • MA794 (0.5X) / MA792 (0.35X): selected when clearance, tool access, or large parts dominate the workflow.
Optics Cleaning (Recommended for High-Detail Configurations)

High-detail setups are highly sensitive to haze, fingerprints, and micro-particulate films. Use optical-grade swabs and specialty low-lint wipers to clean coated optics without shedding fibers that can mask fine features.


Link to Meiji MA802 Product Details: Manufacturer Product Page

Related EMZ-8 Auxiliary Lenses Available From SOSCleanroom.com

Notes: Working distance can vary slightly by measurement method and microscope configuration. Treat auxiliary lens factor and bench configuration as controlled inputs in defect-sensitive inspection programs.

Product page updated: Jan. 21, 2026 (SOS Technical Staff)

© 2026 SOS Supply. All rights reserved.

The Technical Vault
By SOSCleanroom
Last reviewed: Jan. 21, 2026 | Audience: cleanroom operations, QA/QC, lab managers, manufacturing engineering, EHS
When to Use a 2.0X Auxiliary Lens on an EMZ-8 Stereo Microscope: Maximum Detail vs. Minimum Clearance
Meiji MA802 — confirm-station design, configuration control, and artifact-vs-defect protection
High-detail confirm inspection Scan vs confirm stations Stereo vs compound education
The one-paragraph answer

The Meiji MA802 is a 2.0X auxiliary lens for EMZ-8 series stereo microscope bodies that increases effective magnification and reduces working distance to roughly 36.6–39.2mm depending on configuration and measurement method. It is primarily a detail-driven confirm-inspection tool. It is not chosen for tool clearance; it is chosen to reduce borderline calls when the defect threshold is small and inspection confidence requires higher apparent size.

Operational warning: With very tight working distance, stability and optics hygiene become dominant. Smudges, haze, and lighting artifacts can be misread as defects if cleaning and lighting are not controlled.

Operational problems MA802 is solving
  • Defects are near the decision threshold: higher apparent size reduces “maybe” calls on micro-scratches, edge chips, and subtle surface anomalies.
  • Confirm inspection must be consistent: a standardized confirm station reduces operator-to-operator variability and decision drift.
  • False rejects are costly: improved inspection confidence can reduce unnecessary rework when lighting and optics are controlled.
  • Artifact-vs-defect confusion: higher-detail setups magnify haze, fingerprints, and film residues—requiring disciplined optics care.
Microscopy education: stereo microscope engineering vs. compound microscope engineering

Stereo microscopes are engineered to support inspection and manipulation: dual optical paths produce depth perception and an erect image, and the platform is configured with stands, lighting, eyepieces, and auxiliary lenses to match workflow constraints. MA802 is one of those workflow-tuning components—used specifically to push a bench toward detail discrimination.

Compound microscopes are generally optimized for higher magnification analytical viewing (often slide-based) and transmitted illumination. Clearance for tools and fixture-based work is typically not the primary design constraint—making the stereo platform the correct architecture when the work is hands-on and production-oriented.

Why this matters for MA802: MA802 is a stereo accessory because stereo microscopy is a production tool—configured to trade clearance for detail when the process calls for a confirm bench.

Best-practice bench design: “scan” vs “confirm” stations

Many high-volume inspection programs run faster and more consistently when benches are assigned roles: a scan station (wide field, high clearance) for fast coverage and orientation, and a confirm station (higher apparent detail) for borderline decisions. MA802 is typically the confirm-station accessory.

Configuration control (minimum recommended fields)
  • Microscope body (EMZ-8 model variant)
  • Eyepiece model/magnification
  • Auxiliary lens factor (MA802 2.0X)
  • Stand type and typical working height
  • Illumination type and typical intensity/geometry settings
Optics hygiene discipline (artifact-vs-defect protection)

With tight working distance, optics sit very close to the work zone. Implement a simple, repeatable optics-care routine: remove loose particles first, wipe gently with optical-grade tools, and replace swabs/wipers frequently to prevent re-depositing contamination.

Suggested optics-cleaning SOP insert (template-style)
  1. Remove loose particulate before wiping to avoid dragging grit across coated optics.
  2. Use a fresh optical swab/wiper; dampen with minimal approved solvent.
  3. Wipe gently in one direction; avoid heavy pressure and repeated scrubbing.
  4. Replace the cleaning surface frequently; do not reuse a loaded swab/wiper.
  5. Cover the microscope when idle to reduce airborne deposition.
Source basis
  • SOSCleanroom product listing context (application positioning and program-fit language).
  • Manufacturer product page for MA802 (2.0X factor; published working distance value).
  • Common inspection microscopy best practices: scan vs confirm workflow design, configuration control, and optics hygiene discipline.
Compliance note: This Technical Vault article is provided for educational support. Always follow facility SOPs, QA requirements, and validation/qualification plans.
Document control: Rev. Jan. 21, 2026 (SOS Technical Staff)
© 2026 SOS Supply. All rights reserved.